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(parent: 2c9e125)
t5520: improve test style
authorDenton Liu <redacted>
Tue, 12 Nov 2019 23:07:48 +0000 (15:07 -0800)
committerJunio C Hamano <redacted>
Thu, 21 Nov 2019 00:41:51 +0000 (09:41 +0900)
commite8d1eaf9b4b8cec4928962084d07147e0161a88e
tree947d1dcd0bc6d9b8638f4d729c76bb6c887d382atree | snapshot
parent2c9e125b2727c33dccdba1b2a46f462b77e10bedcommit | diff
t5520: improve test style

Improve the test style by removing leading and trailing empty lines
within test cases. Also, reformat multi-line subshells to conform to the
existing style.

Signed-off-by: Denton Liu <redacted>
Signed-off-by: Junio C Hamano <redacted>
t/t5520-pull.sh diff | blob | history
git clone https://git.99rst.org/PROJECT